Emission and life characteristics of thin film top-layer scandate cathode and diffusion of Sc2O3 and W

Applied Surface Science

Volumn 146, Issue 1, 1999, Pages 31-38

  Uda, Eiichirou ^a   Nakamura, Osamu ^a   Matsumoto, Sadao ^a   Higuchi, Toshiharu ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DIFFUSION IN SOLIDS; ELECTRON EMISSION; SCANDIUM COMPOUNDS; THERMIONIC EMISSION; THIN FILM DEVICES; TUNGSTEN;

SCANDATE CATHODES; SCANDIUM OXIDE;

THERMIONIC CATHODES;

EID: 0032630334     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00067-7     Document Type: Article

References (10)

1. A.I. Figner, A.I. Soleveichik, I.V. Judinskaja, United States Patent, 3358178.
2. Hasker J., Crombeen J.E. IEEE Trans. Electron Devices. 37:1990;2589.
3. Yamamoto S., Sasaki S., Taguchi S., Watanabe I., Koganezawa N. Appl. Surf. Sci. 33/34:1988;1200.
4. Gärtner G., Geittner P., Lydin H., Ritz A. Appl. Surf. Sci. 111:1997;11.
5. Magnus S.H., Hill D.N., Ohlinger W.L. Appl. Surf. Sci. 111:1997;50. and references therein.
6. Kimura S., Higuchi T., Ouchi Y., Uda E., Nakamura O., Sudo T., Koyama K. Appl. Surf. Sci. 111:1997;60.
7. Yamamoto S., Taguchi T., Sasaki S., Watanabe I. Jpn. J. Appl. Phys. 28:1989;L865.
8. K.A. Gschneider, Jr., in: C.T. Holovitz (Ed.), Scandium Its Occurrence, Chemistry, Physics, Metallurgy, Biology and Technology, Academic Press, London, 1975, p. 104.
9. Arkhipova N.K., Klotsman S.M., Polikarpova I.P., Tatarinova G.N., Timofeev A.N., Veretennikov L.M. Phys. Rev. B. 30:1984;1788.
10. Hasker J., Van Esdonk J., Crombeen J.E. Appl. Surf. Sci. 26:1986;173.