Model-based methods for textile fault detection

International Journal of Imaging Systems and Technology

Volumn 10, Issue 4, 1999, Pages 339-346

  Campbell, J G ^a   Fraley, C ^b,c   Stanford, D ^b   Murtagh, F ^d   Raftery, A E ^b  

^a UNIVERSITY OF ULSTER   (United Kingdom)

^b UNIVERSITY OF WASHINGTON   (United States)

^c Parametric Technology Corporation   (United States)

^d QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FABRICS; FOURIER TRANSFORMS; MATHEMATICAL MODELS; RANDOM PROCESSES; STATISTICAL METHODS;

MAXIMUM LIKELIHOOD BINARIZATION;

PATTERN RECOGNITION;

EID: 0032630236     PISSN: 08999457     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1098-1098(1999)10:4<339::AID-IMA5>3.0.CO;2-3     Document Type: Article

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