0.18 μm CMOS and beyond

Proceedings - Design Automation Conference

Volumn , Issue , 1999, Pages 703-708

  Eaglesham, D J ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LARGE SCALE SYSTEMS; SEMICONDUCTING SILICON;

SCALING PROCESS;

CMOS INTEGRATED CIRCUITS;

EID: 0032630146     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/309847.310032     Document Type: Conference Paper

References (10)