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Volumn 40, Issue 2, 1999, Pages 401-402

Preparation of well-defined polymer brushes on silicon substrate by the surface-initiated ATRP technique and their characterization

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FORCE MEASUREMENT; FREE RADICAL POLYMERIZATION; GRAFT COPOLYMERS; INITIATORS (CHEMICAL); MOLECULAR STRUCTURE; MOLECULAR WEIGHT; SILICON; TOLUENE;

EID: 0032629922     PISSN: 00323934     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (5)

References (11)
  • 11
    • 6544258193 scopus 로고    scopus 로고
    • Unpublished data
    • Unpublished data.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.