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Volumn 34, Issue 3, 1999, Pages 461-468
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Effect of stacking fault energy and strain rate on the microstructural evolution during room temperature tensile testing in Cu and Cu-Al dilute alloys
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Author keywords
[No Author keywords available]
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Indexed keywords
ADDITION REACTIONS;
BAND STRUCTURE;
COPPER;
CRYSTAL MICROSTRUCTURE;
DEFORMATION;
ELECTRON ENERGY LEVELS;
ELECTRON TRANSITIONS;
GRAIN SIZE AND SHAPE;
STACKING FAULTS;
STRAIN RATE;
TENSILE TESTING;
TWINNING;
LOWER ENERGY CONFIGURATIONS;
STACKING FAULT ENERGY;
COPPER ALLOYS;
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EID: 0032629153
PISSN: 00222461
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1004526208389 Document Type: Article |
Times cited : (24)
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References (14)
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