Ellipsometric studies on thin silver films epitaxially grown on Si(111)

Thin Solid Films

Volumn 343-344, Issue 1-2, 1999, Pages 187-190

  Masten, A ^a   Wissmann, P ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Ellipsometry; Optical properties; Thin silver films

Indexed keywords

ANNEALING; DEPOSITION; ELLIPSOMETRY; EPITAXIAL GROWTH; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; SCANNING ELECTRON MICROSCOPY; SILICON; SILVER; SINGLE CRYSTALS; SUBSTRATES; X RAY CRYSTALLOGRAPHY;

THIN SILVER FILMS;

METALLIC FILMS;

EID: 0032628688     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01602-2     Document Type: Article

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