Auger electron spectroscopy of super-doped Si:Mn thin films

Applied Surface Science

Volumn 142, Issue 1, 1999, Pages 537-542

  Abe, S ^a   Nakasima, Y ^a   Okubo, S ^a   Nakayama, H ^a   Nishino, T ^a   Yanagi, H ^a   Ohta, H ^a   Iida, S ^b  

^a KOBE UNIVERSITY   (Japan)

^b OSAKA SANGYO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON ENERGY LEVELS; ELECTRONIC STRUCTURE; LASER ABLATION; MANGANESE; MOLECULAR BEAM EPITAXY; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING;

FERROMAGNETIC SEMICONDUCTORS; MANGANESE DOPED SILICON;

THIN FILMS;

EID: 0032628459     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00704-1     Document Type: Article

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