Nondestructive quantification of internal damage in rough rice caused by insects and fungus

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3543, Issue , 1999, Pages 111-118

  Cardarelli, Anthony J ^a   Tao, Yang ^a   Bernhardt, John L ^a   Lee, Fleet N ^a  

^a UNIVERSITY OF ARKANSAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGRICULTURAL ENGINEERING; CAMERAS; CHARGE COUPLED DEVICES; CROPS; GRAIN (AGRICULTURAL PRODUCT); HULLS (SEED COVERINGS); IMAGE ANALYSIS; IMAGE SEGMENTATION; MATHEMATICAL OPERATORS;

RICE GRADING; STINK BUGS;

COMPUTER VISION;

EID: 0032628029     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (10)