Critical radius for interface separation of a compressively stressed film from a rough surface

Acta Materialia

Volumn 47, Issue 6, 1999, Pages 1749-1756

  Clarke, D R ^a   Pompe, W ^b  

^a University of California   (United States)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CRACKS; ELASTIC MODULI; FRACTURE; INTERFACES (MATERIALS); INTERFACIAL ENERGY; NUMERICAL METHODS; OXIDATION; RESIDUAL STRESSES; STRAIN; SURFACE ROUGHNESS; THICKNESS MEASUREMENT;

COMPRESSIVELY STRESSED FILM; ELASTIC STRAIN; FILM STRESS; FILM THICKNESS; FRACTURE RESISTANCE; INTERFACE SEPARATION;

THIN FILMS;

EID: 0032627905     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(99)00078-6     Document Type: Article

References (9)

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9. He, M.-Y., Clarke, D. R. and Evans, A. G., in preparation.