Characterization of active thermographic system performance

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3700, Issue , 1999, Pages 388-392

  Shepard, S M ^a   Ahmed, T ^a  

^a THERMAL WAVE IMAGING INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NONDESTRUCTIVE EXAMINATION; SAMPLING; SURFACES; THERMODYNAMIC PROPERTIES;

MODULATION TRANSFER FUNCTION; THERMOGRAPHIC NONDESTRUCTIVE TESTING;

THERMOGRAPHY (IMAGING);

EID: 0032627887     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (2)