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Volumn 65, Issue 1, 1999, Pages 37-45
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18O- time-of-flight secondary ion mass spectrometry technique to map the relative photooxidation resistance of automotive paint systems
b
4605 RFD
*
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
ADDITIVES;
IONS;
OXIDATION RESISTANCE;
OXYGEN;
PIGMENTS;
SECONDARY ION MASS SPECTROMETRY;
ULTRAVIOLET RADIATION;
WEATHERING;
AUTOMOTIVE PAINT SYSTEMS;
PHOTOOXIDATION;
PHOTOOXIDATION RESISTANCE;
TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;
PAINT;
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EID: 0032627698
PISSN: 01413910
EISSN: None
Source Type: Journal
DOI: 10.1016/S0141-3910(98)00214-6 Document Type: Article |
Times cited : (19)
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References (22)
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