Scanning electron acoustic imaging of residual stress distributions in ceramic coatings and sintered ceramics

Materials Letters

Volumn 39, Issue 6, 1999, Pages 335-338

  Liao, J ^a   Yang, Y ^a   Jiang, X P ^a   Hui, S X ^a   Yin, Q R ^a  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON STEEL; CERAMIC COATINGS; CRACKS; PIEZOELECTRIC TRANSDUCERS; RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; SINTERING; STRESS ANALYSIS; STRESS CONCENTRATION;

SCANNING ELECTRON ACOUSTIC MICROSCOPY (SEAM);

TITANIUM NITRIDE;

EID: 0032627643     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(99)00030-0     Document Type: Article

References (7)

1. Brandis E., Rosencwaig A. Appl. Phys. Lett. 37:1980;98.
2. Cargill G.S. III Nature. 28:1980;691.
3. Rosencwaig A. Electron Lett. 16:1980;928.
4. Davies D.G. Scanning Electron Microsc. III:1983;1163.
5. Zhang B.Y., Jiang F.M., Yin Q.R., Kojima S. J. Appl. Phys. 80(3):1996;1916.
6. Zhang B.Y., Jiang F.M., Shi Y., Yin Q.R. Appl. Phys. Lett. 70(5):1997;589.
7. Opsal J., Rosencwaig A. J. Appl. Phys. 53:1982;4240.