Characterization of AgxAuy nano particles by TEM and STEM

Journal of analytical atomic spectrometry

Volumn 14, Issue 3, 1999, Pages 499-504

  De Vyt, Ann ^a   Gijbels, Renaat ^a   Davock, Helen ^b   Van Roost, Chris ^c   Geuens, Ingrid ^c  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b UNIVERSITY OF LIVERPOOL   (United Kingdom)

^c AGFA GEVAERT N V   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

BIMETALS; CATALYST ACTIVITY; COMPOSITION; ELECTRON BEAMS; ENERGY DISPERSIVE SPECTROSCOPY; ERROR ANALYSIS; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

DETECTION LIMIT; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM);

SILVER ALLOYS;

EID: 0032627334     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/a807695b     Document Type: Article

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