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Volumn 19, Issue 11, 1999, Pages 2021-2026

Structural data from x-ray powder diffraction of a new phase formed in the Si3N4-La2O3-Y2O 3 system after oxidation in air

Author keywords

Powders solid state reaction; Rietveld refinement.; Si3N4; Silicates; X ray method

Indexed keywords

CRYSTAL STRUCTURE; LANTHANUM; OXIDATION; SILICON NITRIDE; SINTERING; X RAY POWDER DIFFRACTION; YTTRIUM;

EID: 0032627018     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(99)00005-9     Document Type: Article
Times cited : (23)

References (14)
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    • Gogotsi, Y.G.1    Grathwohl, G.2
  • 2
    • 0027282886 scopus 로고
    • Corrosion of silicon nitride ceramics in combustion environments
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    • Jacobson, N.S.1
  • 3
    • 0030736524 scopus 로고    scopus 로고
    • Corrosion of non oxide ceramics
    • Nickel K.G. Corrosion of non oxide ceramics. Ceramics International. 23:1997;127-133.
    • (1997) Ceramics International , vol.23 , pp. 127-133
    • Nickel, K.G.1
  • 4
    • 0032462254 scopus 로고    scopus 로고
    • High oxidation resistance of hot pressed silicon nitride containing yttria and lanthania
    • Monteverde, F. and Bellosi, A., High oxidation resistance of hot pressed silicon nitride containing yttria and lanthania. J. Eur. Cer. Soc., 1998, 18(16), 2313-2321.
    • (1998) J. Eur. Cer. Soc. , vol.18 , Issue.16 , pp. 2313-2321
    • Monteverde, F.1    Bellosi, A.2
  • 9
    • 0004309175 scopus 로고    scopus 로고
    • Federal Institute for Materials Research and Testing, Berlin
    • Kraus, W. and Nolze, G., PowderCell for Windows 1·0. Federal Institute for Materials Research and Testing, Berlin, 1997.
    • (1997) PowderCell for Windows 1·0
    • Kraus, W.1    Nolze, G.2
  • 10
    • 0040044610 scopus 로고    scopus 로고
    • ICDD cards nos. 44-346 and 47-452. International Centre for Diffraction Data, Newtown Square.
    • ICDD cards nos. 44-346 and 47-452. International Centre for Diffraction Data, Newtown Square.
  • 12
    • 0022540616 scopus 로고
    • X-ray diffraction data from yttrium silicates
    • Liddell K., Thompson D.P. X-ray diffraction data from yttrium silicates. Br. Ceram. Trans. J. 85:1986;17-22.
    • (1986) Br. Ceram. Trans. J. , vol.85 , pp. 17-22
    • Liddell, K.1    Thompson, D.P.2
  • 13
    • 0002958958 scopus 로고
    • Data collection strategies: Fitting the experiment to the need
    • ed. R. A. Young IUCr/Oxford University Press, Oxford.
    • Hill, R. J., Data collection strategies: fitting the experiment to the need. In The Rietveld Method, ed. R. A. Young IUCr/Oxford University Press, Oxford. 1995, pp. 61-101.
    • (1995) In the Rietveld Method , pp. 61-101
    • Hill, R.J.1
  • 14
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    • Background modelling in Rietveld analysis
    • ed. R. A. Young IUCr/Oxford University Press, Oxford
    • Richardson Jr, J. W., Background modelling in Rietveld analysis. In The Rietveld Method, ed. R. A. Young IUCr/Oxford University Press, Oxford, 1995, pp. 102-110.
    • (1995) In the Rietveld Method , pp. 102-110
    • Richardson J.W., Jr.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.