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Volumn 47, Issue 6, 1999, Pages 1879-1887

Simulation of the influence of particles on grain structure evolution in two-dimensional systems and thin films

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL MICROSTRUCTURE; GRAIN BOUNDARIES; GRAIN GROWTH; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; PARTICLE SIZE ANALYSIS; THIN FILMS; VOLUME FRACTION;

EID: 0032626321     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(99)00039-7     Document Type: Article
Times cited : (40)

References (29)
  • 24
    • 0004231024 scopus 로고
    • American Society for Metals, Cleveland, Ohio
    • von Neumann, J., Metal Interfaces. American Society for Metals, Cleveland, Ohio, 1952, p. 108
    • (1952) Metal Interfaces , pp. 108
    • Von Neumann, J.1
  • 26
    • 0002186556 scopus 로고
    • quoted by Smith, C. S.
    • Zener, C. quoted by Smith, C. S., Trans. TMS-AIME, 1949, 175, 15
    • (1949) Trans. TMS-AIME , vol.175 , pp. 15
    • Zener, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.