Log-periodic time-to-failure analysis

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3586, Issue , 1999, Pages 178-188

  Sornette, D ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC EMISSION TESTING; AIRCRAFT PARTS AND EQUIPMENT; FAILURE ANALYSIS; STRESS ANALYSIS; STRUCTURAL ANALYSIS;

LOG-PERIODIC PATTERNS; TIME-TO-FAILURE ANALYSIS;

FATIGUE OF MATERIALS;

EID: 0032626050     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (52)