Sample path analysis for continuous tandem production lines

Discrete Event Dynamic Systems: Theory and Applications

Volumn 9, Issue 3, 1999, Pages 211-239

  Shi, Leyuan ^a   Fu, Bor Ruey ^b   Suri, Rajan ^a  

^a University of Wisconsin Madison   (United States)

^b Iomega Corp   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL PATH ANALYSIS; PERTURBATION TECHNIQUES; RANDOM PROCESSES; THROUGHPUT;

INFINITESIMAL PERTURBATION ANALYSIS (IPA); SAMPLE PATH ANALYSIS;

PRODUCTION CONTROL;

EID: 0032625583     PISSN: 09246703     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008345330312     Document Type: Article

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