Image sensors in TFA technology - status and future trends

Materials Research Society Symposium - Proceedings

Volumn 507, Issue , 1999, Pages 327-338

  Boehm, M ^a   Blecher, F ^a   Eckhardt, A ^a   Seibel, K ^a   Schneider, B ^a   Sterzel, J ^a   Benthien, S ^a   Keller, H ^a   Lule, T ^a   Rieve, P ^a   Sommer, M ^a   Van Uffel, B ^a   Librecht, F ^a   Lind, R C ^a   Humm, L ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; APPLICATION SPECIFIC INTEGRATED CIRCUITS; HYDROGENATION; PHOTODETECTORS; SEMICONDUCTING SILICON; THERMAL EFFECTS; THIN FILM DEVICES;

AUTOADAPTIVE SENSORS; DARK CURRENTS;

IMAGE SENSORS;

EID: 0032625041     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)