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Volumn 3680, Issue II, 1999, Pages 611-619
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Integrated multicolor detector utilizing 1-D photonic bandgap filter with wedge-shaped defect
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALS;
INFRARED SPECTROPHOTOMETERS;
INTERFEROMETERS;
MICROELECTROMECHANICAL DEVICES;
MICROMACHINING;
MIRRORS;
OPTICAL FILTERS;
SEMICONDUCTING SILICON COMPOUNDS;
SEMICONDUCTOR DEVICE STRUCTURES;
SENSITIVITY ANALYSIS;
SPUTTER DEPOSITION;
THIN FILMS;
BRAGG REFLECTORS;
FIZEAU INTERFEROMETERS;
INTEGRATED MULTICOLOR DETECTORS;
INTEGRATED ONE-DIMENSIONAL PHOTONIC BANDGAP (PBG) FILTERS;
MICROFABRICATIONS;
MICROOPTOELECTROMECHANICAL SYSTEMS (MOEMS);
PHOTONIC CRYSTALS;
PHOTODETECTORS;
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EID: 0032624994
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.341252 Document Type: Conference Paper |
Times cited : (9)
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References (17)
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