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Volumn 3680, Issue II, 1999, Pages 611-619

Integrated multicolor detector utilizing 1-D photonic bandgap filter with wedge-shaped defect

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; INFRARED SPECTROPHOTOMETERS; INTERFEROMETERS; MICROELECTROMECHANICAL DEVICES; MICROMACHINING; MIRRORS; OPTICAL FILTERS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SENSITIVITY ANALYSIS; SPUTTER DEPOSITION; THIN FILMS;

EID: 0032624994     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.341252     Document Type: Conference Paper
Times cited : (9)

References (17)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.