Improving the manufacturing test interval and costs for telecommunication equipment

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 1999, Pages 410-417

  Jain, Aridaman K ^a   Saraidaridis, Charalampos I ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSTS; ELECTRIC NETWORK ANALYSIS; RELIABILITY; SAMPLING;

HIGH VOLUME CIRCUIT PACKS;

TELECOMMUNICATION EQUIPMENT;

EID: 0032623503     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/rams.1999.744152     Document Type: Conference Paper

References (6)