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These matrices are often used in analyzing multilayer dielectric coatings, as can be found in, e.g., Ref. 18. We, however, adopted a slightly modified definition of Eq. (4) that does not distinguish the direction of incidence. (The results are identical except for constant offsets in the definition of detunings
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These matrices are often used in analyzing multilayer dielectric coatings, as can be found in, e.g., Ref. 18. We, however, adopted a slightly modified definition of Eq. (4) that does not distinguish the direction of incidence. (The results are identical except for constant offsets in the definition of detunings.)
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