FeTaN films with ultrafine grain structure

Journal of Applied Physics

Volumn 85, Issue 8 II A, 1999, Pages 4562-4564

  Chen, Yingjian ^a   Hossain, Syed ^a   Qian, Chester ^a   Miller, Mark ^a   Long, Hua Ching ^a  

^a WESTERN DIGITAL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COERCIVE FORCE; CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; ELECTRIC CONDUCTIVITY OF SOLIDS; IRON ALLOYS; MAGNETIC HYSTERESIS; MAGNETIZATION; MAGNETRON SPUTTERING; SCANNING ELECTRON MICROSCOPY; SOFT MAGNETIC MATERIALS; X RAY DIFFRACTION ANALYSIS;

FULL WIDTH AT HALF MAXIMUM (FWHM); ULTRAFINE GRAIN STRUCTURES;

MAGNETIC FILMS;

EID: 0032621506     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370408     Document Type: Article

References (7)

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