Compensation electronics for larger dynamic range of a SQUID based nondestructive evaluation system

Review of Scientific Instruments

Volumn 70, Issue 9, 1999, Pages 3714-3718

  Kreutzbruck, M V ^a,b   Theiss, A ^a,b   Muck M ^b   Heiden, C ^a,b  

^a JUSTUS LIEBIG UNIVERSITY   (Germany)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE MATERIALS; DEFECTS; EDDY CURRENT TESTING; HIGH TEMPERATURE SUPERCONDUCTORS;

BACKGROUND FIELDS; DEEP LYING DEFECTS;

SQUIDS;

EID: 0032621257     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149982     Document Type: Article

References (14)

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10. We are grateful to Yi Zhang for supplying the rf SQUID used in our measurements.
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