XPS and XRD study of crystalline 3C-SiC grown by sublimation method

Journal of Alloys and Compounds

Volumn 286, Issue 1-2, 1999, Pages 143-147

  Iwanowski, R J ^a   Fronc, K ^a   Paszkowicz, W ^a   Heinonen, M ^b  

^a INSTITUTE OF PHYSICS   (Poland)

^b UNIVERSITY OF TURKU   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CRYSTAL GROWTH; GRAIN SIZE AND SHAPE; POLYCRYSTALS; SUBLIMATION; X RAY CRYSTALLOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE STUDIES;

SILICON CARBIDE;

EID: 0032621061     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(98)00994-3     Document Type: Article

References (20)

1. H. Morkoc, S. Strite, G.B. Gao, M.E. Lin, B. Sverdlov, M. Burns, J. Appl. Phys. 76 (1994) 1363.
2. A.R. Verma, P. Krishna, Polymorphism and polytypism in crystals, in: J. Wiley and Sons, New York, 1966, p. 92.
3. K. Miyoshi, D.H. Buckley, Appl. Surf. Sci. 10 (1982) 357.
4. L. Muehlhoff, W.J. Choyke, M.J. Bozack, J.T. Yates, J. Appl. Phys. 60 (1986) 2842.
5. M.E. Lin, S. Strite, A. Agarwal, A. Salvador, G.L. Zhou, N. Teraguchi, A. Rockett, H. Morkoc, Appl. Phys. Lett. 62 (1993) 357.
6. T. Takeshita, K. Ichige, Y. Kurata, S. Hasegawa, J. Appl. Phys. 69 (1991) 7945.
7. T. Takeshita, Y. Kurata, S. Hasegawa, J. Appl. Phys. 71 (1992) 5395.
8. V.B. Shields, K. Fekade, M.G. Spencer, Appl. Phys. Lett. 62 (1993) 1919.
9. K. Fronc, unpublished
10. Int. Centre for Diffraction Data reference card No 29-1129
11. M.N. Rahaman, L.C. De Jonghe, Am. Ceram. Soc. Bull. 66 (1987) 782.
12. B. Pivac, K. Furic, M. Milun, T. Valla, A. Borghesi, A. Sassella, J. Appl. Phys. 75 (1994) 3586.
13. F.J. Himpsel, F.R. McFeely, A. Taleb-Ibrahimi, J.A. Yarmoff, G. Holinger, Phys. Rev. B 38 (1988) 6084.
14. T.N. Taylor, J. Mater. Res. 4 (1989) 189.
15. M. Takakura, T. Ogura, T. Hayashi, M. Hirose, Jpn. J. Appl. Phys. 27 (1988) L2213.
16. R.J. Iwanowski, J.W. Sobczak, J. Electron Spectr. and Rel. Phenom. 76 (1995) 565.
17. Handbook of X-Ray Photoelectron Spectroscopy, Perkin-Elmer Corporation, Physical Electronics Division, Eden Prairie (Minnesota) USA, 1994.
18. F. Bozso, J.T. Yates, W.J. Choyke, L. Muehlhoff, J. Appl. Phys. 57 (1985) 2771.
19. L. Pauling, The Chemical Bond, Cornell University Press, Ithaca NY, 1967.
20. C.D. Wagner, L.E. Davis, M.V. Zeller, J.A. Taylor, R.H. Raymond, L.H. Gale, Surf. Interface Anal. 3 (1981) 211.