Dependence of magnetic properties on magnetic layer thickness in SmCo/Cr films

Journal of Applied Physics

Volumn 85, Issue 8 II B, 1999, Pages 6145-6147

  Takei, Shigeto ^a   Otagiri, Yoshihiro ^a   Morisako, Akimitsu ^a   Matsumoto, Mitsunori ^a  

^a SHINSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHROMIUM; COERCIVE FORCE; FILM PREPARATION; MAGNETIC RECORDING; SAMARIUM ALLOYS; SURFACE ROUGHNESS;

RECORDING DENSITY;

MAGNETIC THIN FILMS;

EID: 0032620963     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370024     Document Type: Article

References (8)

1. D. E. Laughlin and B. Y. Wong, IEEE Trans. Magn. 27, 4713 (1991).
2. E. M. T. Velu and D. N. Lambeth, J. Appl. Phys. 69, 5157 (1991).
3. E. M. T. Velu and D. N. Lambeth, IEEE Trans. Magn. 28, 3249 (1992).
4. S. Takei, S. Shomura, A. Morisako, M. Matsumoto, and T. Haeiwa, J. Appl. Phys. 81, 4647 (1997).
5. S. Takei, A. Morisako, and M. Matsumoto, J. Magn. Soc. Jpn. 22, S1, 230 (1998).
6. E. W. Singleton, Z. S. Shan, Y. S. Jeong, and D. J. Sellmyer, IEEE Trans. Magn. 31, 2743 (1995).
7. Y. Liu, D. J. Sellmyer, B. W. Robertson, Z. S. Shan, and S. H. Liou, IEEE Trans. Magn. 31, 2740 (1995).
8. Y. Liu, B. W. Robertson, Z. S. Shan, S. H. Liou, and D. J. Sellmyer, J. Appl. Phys. 77, 3831 (1995).