A 400 kHz, fast-sweep Langmuir probe for measuring plasma fluctuations

Review of Scientific Instruments

Volumn 70, Issue 6, 1999, Pages 2681-2688

  Chiodini, G ^a   Riccardi, C ^a   Fontanesi, M ^a  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CURVE FITTING; ELECTRIC CURRENT MEASUREMENT; PLASMA DENSITY; PROBES; VOLTAGE MEASUREMENT;

FAST-SWEEP LANGMUIR PROBE;

PLASMAS;

EID: 0032620802     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149828     Document Type: Article

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