Integral method for echelles covered with lossless or absorbing thin dielectric layers

Applied Optics

Volumn 38, Issue 1, 1999, Pages 47-55

  Popov, Evgeny ^a   Bozhkov, Bozhan ^a   Maystre, Daniel ^b   Hoose, John ^c  

^a INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

^b AIX MARSEILLE UNIVERSITY   (France)

^c Spectronic Instruments Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; DIELECTRIC MATERIALS; ELECTRIC LOSSES; ELECTROMAGNETIC FIELD THEORY; INTEGRAL EQUATIONS; LIGHT POLARIZATION; MAGNESIUM COMPOUNDS; NUMERICAL METHODS; REFLECTION; SPECTRUM ANALYSIS; THIN FILMS;

DIELECTRIC LOSSLESS; ECHELLES; LOSSLESS DIFFRACTION EFFICIENCY; MAGNESIUM FLUORIDE; SURFACE REFLECTIVITY;

DIFFRACTION GRATINGS;

EID: 0032615347     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.000047     Document Type: Article

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