Newly developed matrix-type semiconductor detector for temporally and spatially resolved x-ray analyses ranging down to a few tens eV using a single plasma shot

Review of Scientific Instruments

Volumn 70, Issue 1 II, 1999, Pages 633-636

  Kohagura, J ^a   Cho, T ^a   Hirata, M ^a   Minami, R ^a   Numakura, T ^a   Okamura, T ^a   Sakamoto, Y ^a   Tamano, T ^a   Yatsu, K ^a   Miyoshi, S ^a   Tanaka, S ^b   Sato, K ^c   Inoue, M ^c   Saitoh, Y ^c   Yamamoto, S ^c  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b KYOTO UNIVERSITY   (Japan)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; MIRRORS; PLASMAS; SEMICONDUCTOR DEVICES; SILICA; TEMPERATURE MEASUREMENT; TOMOGRAPHY; X RAYS;

ELECTRON TEMPERATURE; SEMICONDUCTOR X RAY DETECTOR; X RAY ABSORPTION FILTERS; X RAY TOMOGRAPHIC RECONSTRUCTIONS;

RADIATION DETECTORS;

EID: 0032614280     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149522     Document Type: Article

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