Imaging properties of planar-integrated micro-optics

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 16, Issue 5, 1999, Pages 1175-1183

  Testorf, Markus ^a   Jahns, Jürgen ^b  

^a University of Massachusetts   (United States)

^b UNIVERSITY OF HAGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ALGEBRA; APPROXIMATION THEORY; DIFFRACTION; INTEGRATED OPTICS; MATHEMATICAL MODELS; MICROOPTICS; OPTICAL TRANSFER FUNCTION; RAY TRACING;

COMPUTER ALGEBRA; PHASE FILTERS;

IMAGING SYSTEMS;

EID: 0032613497     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.16.001175     Document Type: Article

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