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Volumn , Issue , 1999, Pages 280-285
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In-situ optical measurements of transmittance, and reflectance by ellipsometry on glass, strips and webs in large area coating plants
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ANTIREFLECTION COATINGS;
ANTISTATIC AGENTS;
ELECTRON BEAMS;
ELLIPSOMETRY;
EVAPORATION;
MAGNETRON SPUTTERING;
OPTICAL GLASS;
OPTICAL MULTILAYERS;
POLYETHYLENE TEREPHTHALATES;
REFLECTOMETERS;
STRIP METAL;
VAPOR DEPOSITION;
IN SITU OPTICAL MEASUREMENTS;
LARGE AREA OPTICAL COATINGS;
PLASMA EMISSION MONITOR;
REACTIVE DUAL MAGNETRON SPUTTERING;
REACTIVE ELECTRON BEAM EVAPORATION;
OPTICAL COATINGS;
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EID: 0032613370
PISSN: 07375921
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (8)
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References (4)
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