Magnetostriction and soft magnetic properties of (Co1-xFex)-Al-O granular films with high electrical resistivity

Journal of Applied Physics

Volumn 85, Issue 8 II A, 1999, Pages 4574-4576

  Ohnuma, S ^a   Kobayashi, N ^a   Masumoto, T ^a   Mitani, S ^b   Fujimori, H ^b  

^a Research Institute of Electric and Magnetic Alloys Sendai   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COBALT ALLOYS; COERCIVE FORCE; ELECTRIC CONDUCTIVITY OF SOLIDS; MAGNETIC ANISOTROPY; MAGNETOMETERS; MAGNETOSTRICTION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SOFT MAGNETIC MATERIALS; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

VIBRATING SAMPLE MAGNETOMETERS (VSM);

MAGNETIC THIN FILMS;

EID: 0032607901     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370412     Document Type: Article

References (12)

1. M. Mino, K. Yanagisawa, A. Tago, and T. Yachi, APEC Record 422 (1996).
2. A. Hosono and Y. Shimada, J. Magn. Soc. Jpn. 12, 295 (1988).
3. S. Ohnuma, H. Fujimori, S. Furukawa, S. Mitani, and T. Masumoto, J. Alloys. Compd. 222, 167 (1995); J. Appl. Phys. 79, 5130 (1996).
4. S. Ohnuma, H. Fujimori, S. Furukawa, S. Mitani, and T. Masumoto, J. Alloys. Compd. 222, 167 (1995); J. Appl. Phys. 79, 5130 (1996).
5. T. J. Silva, T. M. Crawford, and C. T. Rogers, J. Appl. Phys. (these proceedings).
6. S. Ohnuma, N. Kobayashi, T. Masumoto, and H. Fujimori, J. Magn. Soc. Jpn. 22, 441 (1998).
7. G. Herzer, IEEE Trans. Magn. 26, 1397 (1990).
8. N. Hasegawa and M. Saito, J. Magn. Soc. Jpn. 14, 313 (1990).
9. R. M. Bozorth, Ferromagnetism (Van Nostrand, New Jersey, 1951).
10. T. Sato, H. Tomita, A. Sawabe, T. Inoue, T. Mizoguchi, and M. Sahashi, IEEE Trans. Magn. 30, 217 (1994).
11. H. Warlimont and H. R. Hilzinger, in Rapidly Quenched Metals, edited by T. Masamoto and K. Suzuki (Japan Institute of Metals, Sendai, 1982), p. 1167.
12. S. Ohnuma, K. Shirakawa, S. Murakami, E. Sugawara, and T. Masumoto, Techn. Mtg. Magnetics, IEEE of Japan, MAG-98-90, 13 (1998).