Electrostriction of near-critical SF6 in microgravity

Physical Review Letters

Volumn 82, Issue 26, 1999, Pages 5253-5256

  Zimmerli, G A ^a   Wilkinson, R A ^b   Ferrell, R A ^c   Moldover, M R ^d  

^a Natl Ctr for Microgravity Research   (United States)

^b NASA GLENN RESEARCH CENTER   (United States)

^c University of Maryland   (United States)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; DENSITY MEASUREMENT (SPECIFIC GRAVITY); ELECTROSTRICTION; INTERFEROMETRY; MATHEMATICAL MODELS; MICROGRAVITY PROCESSING; PRESSURE EFFECTS; REFRACTIVE INDEX; THERMAL EFFECTS;

SULFUR HEXAFLUORIDE;

SULFUR COMPOUNDS;

EID: 0032607808     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.82.5253     Document Type: Article

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