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Volumn 70, Issue 1 II, 1999, Pages 581-585
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An optimized multifoil soft x-ray spectrometer for the determination of the electron temperature with high time resolution
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Consorzio RFX
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(Italy)
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Author keywords
[No Author keywords available]
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Indexed keywords
DIODES;
ELECTRONS;
INTERFEROMETERS;
MEASUREMENT ERRORS;
MODULATION;
PLASMAS;
SPURIOUS SIGNAL NOISE;
TEMPERATURE MEASUREMENT;
BERYLLIUM FILTERS;
ELECTRON TEMPERATURE;
SOFT X RAY DIODES;
X RAY SPECTROMETERS;
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EID: 0032607718
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1149342 Document Type: Article |
Times cited : (32)
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References (12)
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