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Volumn 74, Issue 13, 1999, Pages 1883-1885

Width dependence of giant magnetoresistance in Cu/Co multilayer nanowires

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETISM; ATOMIC FORCE MICROSCOPY; COBALT; COPPER; ELECTRON BEAM LITHOGRAPHY; MAGNETORESISTANCE; MILLING (MACHINING); SCANNING ELECTRON MICROSCOPY;

EID: 0032607525     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123701     Document Type: Article
Times cited : (15)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.