Reduced thermal conductivity in low-temperature-grown GaAs

Applied Physics Letters

Volumn 74, Issue 16, 1999, Pages 2325-2327

  Jackson, A W ^a   Ibbetson, J P ^a   Gossard, A C ^a   Mishra, U K ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; FINITE ELEMENT METHOD; PHONONS; PHOTOLITHOGRAPHY; POINT DEFECTS; RAPID THERMAL ANNEALING; STOICHIOMETRY; THERMAL CONDUCTIVITY OF SOLIDS;

PHONON SCATTERING; SELF-HEATED PHOTOLITHOGRAPHY;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0032607049     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123839     Document Type: Article

References (9)

1. S. Verghese, K. A. McIntosh, and E. R. Brown, Appl. Phys. Lett. 71, 2743 (1997).
2. P. Thompson, Y. Li, J. J. Zhou, D. L. Sato, L. Flanders, and H. P. Lee, Appl. Phys. Lett. 70, 1605 (1997).
3. H. A. Schafft, J. S. Suehle, and P. G. A. Mirel, Proc. IEEE 1989 International Conference on Microelectronic Test Structures, 1989, Vol. 2, p. 121.
4. F. R. Brotzen, P. J. Loos, and D. P. Brady, Thin Solid Films 207, 197 (1992).
5. Ansys/University V. 5.5.
6. W. Nakwaski, J. Appl. Phys. 64, 159 (1988).
7. Z. Liliental-Weber, X. W. Lin, J. Washburn, and W. Schaff, Appl. Phys. Lett. 66, 2086 (1995).
8. G. A. Slack, Phys. Rev. 105, 832 (1957).
9. C. M. Bhandari and D. M. Rowe, Thermal Conduction in Semiconductors (Wiley, New York, 1988).