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Volumn 8, Issue 2-5, 1999, Pages 682-687

UHREM investigation of stacking fault interactions in the CVD diamond structure

Author keywords

Chemical vapour deposition; Local structure; Thin diamond films; Ultra high resolution electron microscopy

Indexed keywords

CHEMICAL VAPOR DEPOSITION; COMPUTER SIMULATION; DISLOCATIONS (CRYSTALS); HIGH RESOLUTION ELECTRON MICROSCOPY; MATHEMATICAL MODELS; SILICON WAFERS; STACKING FAULTS; THIN FILMS;

EID: 0032607048     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0925-9635(98)00255-6     Document Type: Article
Times cited : (13)

References (14)
  • 3
    • 0040709202 scopus 로고
    • in: M. Kamo, H. Kanda, Y. Matsui, T. Sekine (Eds.) NIRIM, Tsukuba
    • J.L. Hutchison, D. Shechtman, in: M. Kamo, H. Kanda, Y. Matsui, T. Sekine (Eds.), Advanced Materials '94, NIRIM, Tsukuba, 1994, pp. 152-156.
    • (1994) Advanced Materials '94 , pp. 152-156
    • Hutchison, J.L.1    Shechtman, D.2
  • 8
    • 0040115405 scopus 로고    scopus 로고
    • in: H.A. Calderón Benavides, M. José Yacamán (Eds.), Institute of Physics, Bristol and Philadelphia
    • S. Delclos, D. Dorignac, F. Phillipp, S. Moulin, A.M. Bonnot, in: H.A. Calderón Benavides, M. José Yacamán (Eds.), Electron Microscopy 1998, Vol. II, Institute of Physics, Bristol and Philadelphia, 1998, pp. 701-702.
    • (1998) Electron Microscopy 1998 , vol.2 , pp. 701-702
    • Delclos, S.1    Dorignac, D.2    Phillipp, F.3    Moulin, S.4    Bonnot, A.M.5
  • 13
    • 0001570098 scopus 로고
    • in: F.R.N. Nabarro (Ed.) North-Holland, Amsterdam
    • S. Amelinckx, in: F.R.N. Nabarro (Ed.), Dislocations in Solids, vol. 2, North-Holland, Amsterdam, 1979, pp. 292-295.
    • (1979) Dislocations in Solids , vol.2 , pp. 292-295
    • Amelinckx, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.