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Volumn 8, Issue 2-5, 1999, Pages 682-687
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UHREM investigation of stacking fault interactions in the CVD diamond structure
a
CEMES CNRS
(France)
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Author keywords
Chemical vapour deposition; Local structure; Thin diamond films; Ultra high resolution electron microscopy
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
COMPUTER SIMULATION;
DISLOCATIONS (CRYSTALS);
HIGH RESOLUTION ELECTRON MICROSCOPY;
MATHEMATICAL MODELS;
SILICON WAFERS;
STACKING FAULTS;
THIN FILMS;
ULTRA-HIGH RESOLUTION ELECTRON MICROSCOPY (UHREM);
DIAMOND FILMS;
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EID: 0032607048
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/s0925-9635(98)00255-6 Document Type: Article |
Times cited : (13)
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References (14)
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