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Journal of Applied Physics

Volumn 86, Issue 2, 1999, Pages 995-998

Microstructure evolution study of Pd-Ge ohmic contact formation on GaAs

(2) Radulescu, F a McCarthy, J M a

a OREGON HEALTH AND SCIENCE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ANNEALING; CRYSTAL MICROSTRUCTURE; DIFFERENTIAL SCANNING CALORIMETRY; EPITAXIAL GROWTH; INTERDIFFUSION (SOLIDS); OHMIC CONTACTS; PALLADIUM ALLOYS; REACTION KINETICS; SEMICONDUCTOR GROWTH; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

CONSTANT HEATING RATE DIFFERENTIAL SCANNING CALORIMETRY; CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; SOLID-STATE REACTIONS;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0032607016 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.370837 Document Type: Article

Times cited : (6)

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