Moessbauer reflectometry of ultrathin multilayer Zr(10 nm)/[57Fe(1.6 nm)/Cr(1.7 nm)×26]/Cr(50 nm) film using synchrotron radiation

Journal of Alloys and Compounds

Volumn 286, Issue 1-2, 1999, Pages 322-332

  Andreeva, M A ^a   Irkaev, S M ^b   Semenov, V G ^c   Prokhorov, K A ^d   Salashchenko, N N ^d   Chumakov, A I ^e   Ruffer R ^e  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b INSTITUTE FOR ANALYTICAL INSTRUMENTATION   (Russian Federation)

^c ST PETERSBURG STATE UNIVERSITY   (Russian Federation)

^d INSTITUTE FOR PHYSICS OF MICROSTRUCTURES   (Russian Federation)

^e EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM; IRON; MAGNETIC FIELDS; METALLIC FILMS; MOSSBAUER SPECTROSCOPY; REFLECTOMETERS; SURFACE STRUCTURE; SYNCHROTRON RADIATION; ULTRATHIN FILMS; ZIRCONIUM;

GRAZING INCIDENCE MOESSBAUER SPECTROSCOPY; TIME-RESOLVED NUCLEAR RESONANT REFLECTIVITY; X RAY REFLECTIVITY;

MULTILAYERS;

EID: 0032606799     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(98)01029-9     Document Type: Article

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