Optical characterization of a compact multilayer-mirror polarimeter in the extreme-ultraviolet range

Applied Optics

Volumn 38, Issue 19, 1999, Pages 4125-4136

  Bailey, Matthew ^a,b   Merabet, Hocine ^a,b   Bruch, Reinhard F ^a,b  

^a DESERT RESEARCH INSTITUTE   (United States)

^b UNIVERSITY OF NEVADA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON TRANSITIONS; HELIUM; IONIZATION OF GASES; LIGHT POLARIZATION; MIRRORS; MOLYBDENUM; OPTICAL MULTILAYERS; PHOTOEMISSION; SILICON; ULTRAVIOLET RADIATION;

EXTREME ULTRAVIOLET (EUV) POLARIMETERS; LYMAN ALPHA EMISSION; MULTILAYER MIRROR POLARIMETERS;

POLARIMETERS;

EID: 0032606558     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.004125     Document Type: Article

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