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Journal of Applied Physics

Volumn 85, Issue 8 II B, 1999, Pages 5414-5416

X-ray photoemission characterization of La0.67(CaxSr1-x)0.33MnO3 films

(3) Broussard, P R a Browning, V M a Cestone, V C a

a NAVAL RESEARCH LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; ELECTRIC CONDUCTIVITY MEASUREMENT; FILM GROWTH; LANTHANUM COMPOUNDS; MAGNETIZATION; MAGNETOMETERS; SQUIDS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

CURIE TEMPERATURE; OFF-AXIS COSPUTTERING;

SUPERCONDUCTING FILMS;

EID: 0032606522 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.369995 Document Type: Article

Times cited : (5)

References (9)

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