Characterization of oxide gas barrier films

Proceedings, Annual Technical Conference - Society of Vacuum Coaters

Volumn , Issue , 1999, Pages 403-407

  Henry, B M ^a   Dinelli, F ^a   Zhao, K Y ^a   Erlat, A G ^a   Grovenor, C R M ^a   Briggs, G A D ^a   Kumar, R S ^a   Howson, R P ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GRAIN SIZE AND SHAPE; HIGH RESOLUTION ELECTRON MICROSCOPY; MAGNETRON SPUTTERING; MICROSTRUCTURE; OXYGEN; POLYETHYLENE TEREPHTHALATES; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; VAPORS;

GAS BARRIER LAYERS; SUCCESSIVE PULSED PLASMA ANODISATION; WATER VAPOUR PERMEATION;

ALUMINA;

EID: 0032606286     PISSN: 07375921     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)