High-speed built-in-self-test design for DRAMs

International Symposium on VLSI Technology, Systems, and Applications, Proceedings

Volumn , Issue , 1999, Pages 50-53

  Huang, Shi Yu ^a   Kwai, Ding Ming ^a  

^a Manufacturing Corp   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; CMOS INTEGRATED CIRCUITS; DYNAMIC RANDOM ACCESS STORAGE; FINITE AUTOMATA; INTEGRATED CIRCUIT LAYOUT; NETWORK PROTOCOLS; PIPELINE PROCESSING SYSTEMS;

FINITE STATE MACHINES; TEST PATTERNS;

INTEGRATED CIRCUIT TESTING;

EID: 0032599265     PISSN: 1524766X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (7)