Ultra-high resolution temperature measurement and thermal management of RF power devices using heat pipes

IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD)

Volumn , Issue , 1999, Pages 145-148

  He, Jun ^a   Mehrotra, Vivek ^a   Shaw, Michael C ^a  

^a ROCKWELL SCIENCE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT PIPES; HEAT RESISTANCE; INFRARED SPECTROSCOPY; POWER AMPLIFIERS; POWER ELECTRONICS; RAMAN SPECTROSCOPY; TEMPERATURE MEASUREMENT;

POWER DEVICES; PYROSPECTROSCOPY; THERMAL MANAGEMENT;

SEMICONDUCTOR DEVICE TESTING;

EID: 0032598933     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (6)