Explosion tests on IGBT high voltage modules

IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD)

Volumn , Issue , 1999, Pages 129-132

  Gekenidis, Sotirios ^a   Ramezani, Ezatollah ^a   Zeller, Hansrudi ^a  

^a ABB SWITZERLAND LTD   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CAPACITANCE; ELECTRIC SURGES; EXPLOSION TESTING; POWER CONVERTERS; SHORT CIRCUIT CURRENTS;

HIGH VOLTAGE MODULES; INSULATED GATE BIPOLAR TRANSISTOR; PLASMA EXPANSION; SNUBBERLESS CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0032598926     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (3)