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Volumn 205, Issue 1, 1999, Pages 50-58
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Study on defects in CZ-Si crystals grown under three different cusp magnetic fields by infrared light scattering tomography
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL DEFECTS;
CRYSTAL GROWTH FROM MELT;
DISLOCATIONS (CRYSTALS);
LIGHT SCATTERING;
MAGNETIC FIELD EFFECTS;
NUMERICAL ANALYSIS;
OXYGEN;
PHOTOLUMINESCENCE;
CUSP MAGNETIC FIELD CONFIGURATIONS;
LOWER DEFECT DENSITY;
MULTI CHROIC INFRARED LIGHT SCATTERING TOMOGRAPHY;
UNIFORM OXYGEN DISTRIBUTION;
SEMICONDUCTING SILICON;
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EID: 0032598209
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(99)00255-9 Document Type: Article |
Times cited : (14)
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References (16)
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