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Volumn , Issue , 1999, Pages 359-362
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Pre-silicon parameter generation methodology using BSIM3 for device/circuit concurrent design
a a a a a
a
HITACHI LTD
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
COMPUTER SIMULATION;
ELECTRIC POWER UTILIZATION;
MICROPROCESSOR CHIPS;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DEVICE MANUFACTURE;
THRESHOLD VOLTAGE;
DEVICE CIRCUIT CONCURRENT DESIGN;
PRE SILICON PARAMETERS;
INTEGRATED CIRCUIT LAYOUT;
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EID: 0032597808
PISSN: 08865930
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (3)
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References (5)
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