RF simulations and physics of the channel noise parameters within MOS transistors

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1999, Pages 369-372

  Manku, Tajinder ^a   Obrecht, Michael ^a   Lin, Yi ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRONS; FOURIER TRANSFORMS; MICROWAVES; RADIO WAVES; SIMULATORS; SPURIOUS SIGNAL NOISE; TRANSFER FUNCTIONS;

DRAIN CHANNEL NOISE; HOT ELECTRONS; INDUCED GATE NOISE; MICROWAVE NOISE SOURCES;

MOSFET DEVICES;

EID: 0032597798     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)