Methodology for measurement and characterization of substrate noise in high frequency circuits

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1999, Pages 487-490

  Gharpurey, Ranjit ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; MIXER CIRCUITS; MOSFET DEVICES; PRINTED CIRCUIT BOARDS; SUBSTRATES; VARIABLE FREQUENCY OSCILLATORS;

HIGH FREQUENCY CIRCUITS; SUBSTRATE NOISE;

SIGNAL NOISE MEASUREMENT;

EID: 0032597768     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (3)