Measurements and analyses of substrate noise waveform in mixed signal IC environment

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1999, Pages 575-578

  Nagata, Makoto ^a   Kashima, Yoji ^a   Tamura, Daisuke ^a   Morie, Takashi ^a   Iwata, Atsushi ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CHARGE TRANSFER DEVICES; CMOS INTEGRATED CIRCUITS; ELECTRIC IMPEDANCE; ELECTRIC POTENTIAL; LOGIC CIRCUITS; SUBSTRATES;

HIGH TEMPORAL RESOLUTION; SUBSTRATE NOISE WAVEFORM;

INTEGRATED CIRCUIT LAYOUT;

EID: 0032597725     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (6)