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Optical Engineering

Volumn 38, Issue 9, 1999, Pages 1582-1585

Nondestructive assessment of thinning of plates using digital shearography

(4) Sirohi, R S a,b,c,d,e,f Tay, C J a Shang, H M a Boo, W P a

a NATIONAL UNIVERSITY OF SINGAPORE (Singapore)

b INDIAN INSTITUTE OF TECHNOLOGY DELHI (India)

c INDIAN INSTITUTE OF TECHNOLOGY MADRAS (India)

d CASE WESTERN RESERVE UNIVERSITY (United States)

e ROSE HULMAN INSTITUTE OF TECHNOLOGY (United States)

f ABDUS SALAM INTERNATIONAL CENTRE FOR THEORETICAL PHYSICS (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; INTERFEROMETRY; MATHEMATICAL MODELS; NONDESTRUCTIVE EXAMINATION; PHASE SHIFT; SPECKLE; STRUCTURAL ANALYSIS;

DIGITAL SHEAROGRAPHY; DIGITAL SPECKLE SHEAR INTERFEROMETRY (DSSI); STRUCTURAL LIFE MANAGEMENT;

PLATES (STRUCTURAL COMPONENTS);

EID: 0032597643 PISSN: 00913286 EISSN: None Source Type: Journal
DOI: 10.1117/1.602210 Document Type: Article

Times cited : (26)

References (9)

1
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- Shearography: A new optical method for strain measurement and non-destructive testing
- Y. Y. Hung, "Shearography: a new optical method for strain measurement and non-destructive testing," Opt. Eng. 21(3), 391-395 (1982).
- (1982) Opt. Eng. , vol.21 , Issue.3 , pp. 391-395
- Hung, Y.Y.¹

2
- 0031333928
- Rapid evaluation of hermetic seals in microelectronics packages using shearography
- Y. Y. Hung and D. Shi, "Rapid evaluation of hermetic seals in microelectronics packages using shearography," Proc. SPIE 2921, 636-642 (1997).
- (1997) Proc. SPIE , vol.2921 , pp. 636-642
- Hung, Y.Y.¹ Shi, D.²

3
- 0004044476
- Academic Press, New York
- R. K. Erf, Ed., Speckle Metrology, Academic Press, New York (1978).
- (1978) Speckle Metrology
- Erf, R.K.¹

4
- 0003928204
- Cambridge University Press, Cambridge
- R. Jones and C. Wykes, Holographic and Speckle Interferometry, Cambridge University Press, Cambridge (1989).
- (1989) Holographic and Speckle Interferometry
- Jones, R.¹ Wykes, C.²

5
- 0004044474
- Marcel Dekker, New York
- R. S. Sirohi, Ed., Speckle Metrology, Marcel Dekker, New York (1993).
- (1993) Speckle Metrology
- Sirohi, R.S.¹

6
- 0003547171
- Milestone Series SPIE Optical Engineering Press, Bellingham, WA
- P. Meinlschmidt, K. D. Hinsch, and R. S. Sirohi, Eds., Selected Papers on Electronic Speckle Pattern Interferometry, Milestone Series 132, SPIE Optical Engineering Press, Bellingham, WA (1996).
- (1996) Selected Papers on Electronic Speckle Pattern Interferometry , vol.132
- Meinlschmidt, P.¹ Hinsch, K.D.² Sirohi, R.S.³

7
- 0024130183
- Computer-aided electronic speckle pattern interferometry (ESPI): Deformation analysis by fringe manipulation
- M. Owner-Petersen and P. Damgaard Jensen, "Computer-aided electronic speckle pattern interferometry (ESPI): deformation analysis by fringe manipulation," NDT Int. 21(6), 422-426 (1988).
- (1988) NDT Int. , vol.21 , Issue.6 , pp. 422-426
- Owner-Petersen, M.¹ Jensen, P.D.²

8
- 77956978378
- Phase-measurement interferometry techniques
- E. Wolf, Ed., Elsevier Science Publishers, Amsterdam
- K. Creath, "Phase-measurement interferometry techniques," in Progress in Optics, E. Wolf, Ed., Vol. 26, pp. 349-393, Elsevier Science Publishers, Amsterdam (1988).
- (1988) Progress in Optics , vol.26 , pp. 349-393
- Creath, K.¹

9
- 0003491390
- McGraw-Hill, New York
- S. P. Timoshenko and S. Woinowsky-Krieger, Theory of Plates and Shells, 2nd ed., pp. 54-56, McGraw-Hill, New York (1959).
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- Timoshenko, S.P.¹ Woinowsky-Krieger, S.²

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